SNOM upgrade for the alpha300 R

Beating the diffraction limit

For optical images with a resolution that surpasses the diffraction limit, the alpha300 R can be upgraded with the Scanning Near-field Optical Microscopy features included in the WITec alpha300 S. It then combines Confocal/Raman Microscopy, AFM and SNOM in a single instrument. Using WITec's unique high-transmission cantilever SNOM-sensors, SNOM and topography images can be obtained simultaneously. For Confocal /Raman measurements, only a simple rotation of the objective turret is necessary to switch between the modes.